RE46C180
DS22275A-page 20
?2011 Microchip Technology Inc.
6. Drive TEST from V
SS
to V
DD
and hold at V
DD
.
Apply another clock pulse to the T2 input, to
enter in TM6 mode. This initiates the calibration
mode for the HUSH sensitivity setting. Drive
TEST from V
DD
to V
SS
to turn on the smoke
comparator and enable the T3 switch. The
HUSH smoke sensitivity V
SEN
will appear at T3.
The smoke comparator output will appear at
TESTOUT. Clock FEED to increase or decrease
the V
SEN
levels as needed. The IO input is
pulsed low-to-high to save the result
7. Drive TEST from V
SS
to V
DD
and hold at V
DD
.
Apply another clock pulse to the T2 input to
enter in TM7 mode. This initiates the calibration
mode for the CHAMBER voltage at PTT/Cham-
ber Test. Drive TEST from V
DD
to V
SS
to turn on
the smoke comparator and enable the T3
switch. The standby smoke sensitivity V
SEN
will
appear at T3. The smoke comparator output will
appear at TESTOUT. Clock FEED to increase or
decrease the CHAMBER voltages as needed.
The IO input is pulsed low-to-high to save the
result.
8. After sensitivity settings and CHAMBER voltage
calibrations have been made, pulse IO to store
all results into memory. Before this step, no
settings are stored into memory.
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